A new publication from Opto-Electronic Advances; DOI 10.29026/oea.2024.240060, discusses multi-prior intelligent microscopy assisted high-throughput, pixel super-resolution quantitative phase imaging.
Recently, a team led by Prof. DU Jiangfeng from the Key Laboratory of Microscale Magnetic Resonance of Chinese Academy of Sciences (CAS) developed a new method for deep electrical impedance tomography ...
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