Amit Sanghani, Vice President of Engineering, HW-Analytics and Test Group at Synopsys, discusses how Silicon Lifecycle Management (SLM) is changing the way we look at the complete device lifecycle ...
A convergence of DFT techniques and the proliferation of in-silicon monitors can flag potential failures before they occur.
The long lead time for the development of blades and vanes used in gas turbines, such as in power stations, presents a significant challenge to the validation of new part designs in engine tests.
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