New research paper titled “Supervised Learning for Coverage-Directed Test Selection in Simulation-Based Verification” from researchers at University of Bristol and Infineon Technologies. “Constrained ...

Analog behavior is difficult to compress into simple pass/fail decisions that could reduce redundant coverage.

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

With more than 20% of organizations deploying updates multiple times per day, according to my company's study, the complexity of test authoring has grown significantly. Test authoring is the process ...